Cal Test Electronics CT4537 Probe Bodies are available in two tip configurations to support a wide range of probing and connection needs. These probes are intended for general electrical testing and provide a durable interface between test instruments and circuits. The CT4537 probe bodies are designed for use with 2mm (CT4537-01) or 4mm (CT4537-02) tips, depending on the variants. The 2mm tip can be used for fine-point contact on dense circuitry and for accessing North American power sockets. The 4mm banana plug tip can be used for direct insertion into banana jacks or for attaching accessories. The CT4537 probes are designed in accordance with IEC 61010-031 and provide 1500V CAT III / 1000V CAT IV protection with the safety cap installed. These probe bodies are ideally suited for industrial, field service, and laboratory environments.
