F6 MS Inspection Probes

Hirose F6 MS Inspection Probes are designed to improve inspection processes and decrease costs because of inspection errors. The F6 MS probes feature a unique floating function in the X, Y, and Z directions to self-align with a board-mounted switch. The inspection probes can tolerate misalignment without the probe tip shifting out of center because of cable motion. The top portion has no moving parts as the flange portion is fixed to the test fixture. Hirose F6 MS Inspection Probes offer a test failure rate of about 100ppm and are ideal for use in any RF application.